Infrared and Laser Engineering, Volume. 53, Issue 3, 20230614(2024)

Method for measuring laser damage threshold of optical thin film elements based on quantitative damage evaluation

Lei Xin, Zhongming Yang*, Jun Meng, and Zhaojun Liu
Author Affiliations
  • School of Information Science and Engineering, Shandong University, Qingdao 266237, China
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    Figures & Tables(13)
    Schematic diagram of laser damage monitoring system
    QELDD method flow chart
    Schematic diagram of the white-light interferometry system
    Bicubic interpolation of interferogram
    Laser damage degree of window plate under different fluence
    3D measurement results of damage model. (a) Simulation damage model; (b) Three-dimensional measurement result; (c) Residual
    Interferogram of simulation model
    Analysis of simulation results. (a) Spatial distribution of deviation; (b) Deviation histograms; (c) Cross-sectional comparison
    Experimental measurement system. (a) Laser damage monitoring system; (b) White-light interferometry measurement system
    Laser damage threshold measurement results of cavity mirrors. (a) QELDD method; (b) S-on-1 method
    Laser damage threshold measurement results of windows. (a) QELDD method; (b) S-on-1 method
    • Table 1. Damage threshold measurement results of laser resonator mirror

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      Table 1. Damage threshold measurement results of laser resonator mirror

      MethodSampleLIDT /J·cm−2
      QELDDM15.10
      M25.61
      S-on-1M35.53
    • Table 2. Damage threshold measurement results of window plate

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      Table 2. Damage threshold measurement results of window plate

      MethodSampleLIDT/J·cm−2
      QELDDW16.62
      W26.53
      S-on-1W36.33
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    Lei Xin, Zhongming Yang, Jun Meng, Zhaojun Liu. Method for measuring laser damage threshold of optical thin film elements based on quantitative damage evaluation[J]. Infrared and Laser Engineering, 2024, 53(3): 20230614

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    Paper Information

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    Received: Nov. 6, 2023

    Accepted: --

    Published Online: Jun. 21, 2024

    The Author Email: Yang Zhongming (zhongming.yang@sdu.edu.cn)

    DOI:10.3788/IRLA20230614

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