NUCLEAR TECHNIQUES, Volume. 48, Issue 2, 020102(2025)
Simulation analysis of superlattice half-order peaks caused by oxygen octahedral rotation in perovskite oxides
[6] Koughia C. Springer handbook of electronic and photonic materials[M]. Springer Science & Business Media(2007).
[18] Zhenhong MAI[M]. X-ray characterization of thin film structure(2015).
Get Citation
Copy Citation Text
Yajun TAO, Yongqi DONG, Zhe SUN, Zhenlin LUO. Simulation analysis of superlattice half-order peaks caused by oxygen octahedral rotation in perovskite oxides[J]. NUCLEAR TECHNIQUES, 2025, 48(2): 020102
Category: SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS
Received: May. 6, 2024
Accepted: --
Published Online: Mar. 14, 2025
The Author Email: LUO Zhenlin (LUOZhenlin)