NUCLEAR TECHNIQUES, Volume. 48, Issue 2, 020102(2025)
Simulation analysis of superlattice half-order peaks caused by oxygen octahedral rotation in perovskite oxides
Fig. 1. Diagrams of oxygen octahedral cell model of perovskite oxide film (a), and 2×2×2 oxygen octahedral supercell model (b)
Fig. 2. Diagram of oxygen ion positions (red atoms) in the oxygen octahedral supercell model during simulation. The numerical identification of the oxygen ion corresponds to the row number of the oxygen ion rotation position calculation matrix (color online)
Fig. 3. Diagrams of oxygen octahedral rotation (a) in the ab-plane in LaAlO3 thin films and the intensity distribution of the resulting half-order peaks in the hkl ((b) l=1, (c) l=3, (d) l=5) planes, respectively (color online)
Fig. 4. Diagrams of oxygen octahedral rotation (a) in LaVO3 thin film, and the intensity distribution of its resulting half-order peaks in the hkl ((b) l=1, (c) l=3, (d) l=5) planes, respectively (color online)
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Yajun TAO, Yongqi DONG, Zhe SUN, Zhenlin LUO. Simulation analysis of superlattice half-order peaks caused by oxygen octahedral rotation in perovskite oxides[J]. NUCLEAR TECHNIQUES, 2025, 48(2): 020102
Category: SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS
Received: May. 6, 2024
Accepted: --
Published Online: Mar. 14, 2025
The Author Email: LUO Zhenlin (LUOZhenlin)