Journal of Terahertz Science and Electronic Information Technology , Volume. 20, Issue 6, 626(2022)

Parasitic modes caused by defect ground structure in multilayer integrated circuit

HOU Yanfei1,2、*, WANG Bowu1, YU Weihua1, CHENG Wei3, and SUN Yan3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(5)

    [1] [1] ERIKSSON K,GUNNARSSON S E,NILSSON P. Suppression of parasitic substrate modes in multilayer integrated circuits[J]. IEEE Transactions on Electromagnetic Compatibility, 2015,57(3):591-594.

    [2] [2] HAN S M,KIM J O,YOON W S,et al. Design and characterization of the double-layered defected ground structure transmission line with less radiation loss[J]. Microwave and Optical Technology Letters, 2019(61):903-906.

    [4] [4] LI Oupeng,ZHANG Yong,ZHANG Tiedi,et al. 140 GHz power amplifier based on 0.5 μm composite collector InP DHBT[J]. IEICE Electronics Express, 2017,14(8):1-6. doi:org/10.1587/elex.14.20170191.

    [5] [5] CHEN Yapei,XU Yuehang,SUN Yan,et al. Investigation of Terahertz 3D EM simulation on device modeling and a new InP HBT dispersive inter-electrode impedance extraction method[J]. IEEE Access, 2018(6):45772-45781.

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    HOU Yanfei, WANG Bowu, YU Weihua, CHENG Wei, SUN Yan. Parasitic modes caused by defect ground structure in multilayer integrated circuit[J]. Journal of Terahertz Science and Electronic Information Technology , 2022, 20(6): 626

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    Paper Information

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    Received: Mar. 30, 2020

    Accepted: --

    Published Online: Aug. 15, 2022

    The Author Email: Yanfei HOU (lucashou@163.com)

    DOI:10.11805/tkyda2020132

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