Journal of Terahertz Science and Electronic Information Technology , Volume. 20, Issue 6, 626(2022)
Parasitic modes caused by defect ground structure in multilayer integrated circuit
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HOU Yanfei, WANG Bowu, YU Weihua, CHENG Wei, SUN Yan. Parasitic modes caused by defect ground structure in multilayer integrated circuit[J]. Journal of Terahertz Science and Electronic Information Technology , 2022, 20(6): 626
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Received: Mar. 30, 2020
Accepted: --
Published Online: Aug. 15, 2022
The Author Email: Yanfei HOU (lucashou@163.com)
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