Optics and Precision Engineering, Volume. 17, Issue 5, 964(2009)
Measuring and analyzing system for retardation films at different wavelengths
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SHEN Yi, WANG Yong-jing, WANG Lin-jing, JIANG Yan-sen, CHEN Shao-yuan. Measuring and analyzing system for retardation films at different wavelengths[J]. Optics and Precision Engineering, 2009, 17(5): 964
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Received: Jul. 2, 2008
Accepted: --
Published Online: Oct. 28, 2009
The Author Email: Yi SHEN (yishen@goworld-lcd.com)
CSTR:32186.14.