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Optics and Precision Engineering, Volume. 17, Issue 5, 964(2009)

Measuring and analyzing system for retardation films at different wavelengths

SHEN Yi1,*... WANG Yong-jing2, WANG Lin-jing3, JIANG Yan-sen4 and CHEN Shao-yuan1 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    SHEN Yi, WANG Yong-jing, WANG Lin-jing, JIANG Yan-sen, CHEN Shao-yuan. Measuring and analyzing system for retardation films at different wavelengths[J]. Optics and Precision Engineering, 2009, 17(5): 964

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    Paper Information

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    Received: Jul. 2, 2008

    Accepted: --

    Published Online: Oct. 28, 2009

    The Author Email: Yi SHEN (yishen@goworld-lcd.com)

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology