Optical Instruments, Volume. 42, Issue 2, 57(2020)
Molecular dynamics simulation of AFM scratching on silicon with varying load
Fig. 5. The vertical view and lateral view piles distribution on different scratching velocity
Fig. 7. The vertical view and lateral view piles distribution on different probe radius
Fig. 8. The wears and tears of probe(
Fig. 10. The vertical view and lateral view pile distribution on different probe wedge angles
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Yan MA, Jun PENG. Molecular dynamics simulation of AFM scratching on silicon with varying load[J]. Optical Instruments, 2020, 42(2): 57
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Received: Jun. 19, 2019
Accepted: --
Published Online: May. 27, 2020
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