Optical Instruments, Volume. 42, Issue 2, 57(2020)

Molecular dynamics simulation of AFM scratching on silicon with varying load

Yan MA and Jun PENG
Author Affiliations
  • School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
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    Figures & Tables(10)
    The model of AFM scratching
    The model of AFM probe
    A schematic diagram of the pile distribution
    The pile distribution on different scratching velocity
    The vertical view and lateral view piles distribution on different scratching velocity
    The pile distribution on different probe radius
    The vertical view and lateral view piles distribution on different probe radius
    The wears and tears of probe(r=1 nm)and the deform of probe(r=1.5 nm)
    The pile distribution on different probe wedge angles
    The vertical view and lateral view pile distribution on different probe wedge angles
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    Yan MA, Jun PENG. Molecular dynamics simulation of AFM scratching on silicon with varying load[J]. Optical Instruments, 2020, 42(2): 57

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    Paper Information

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    Received: Jun. 19, 2019

    Accepted: --

    Published Online: May. 27, 2020

    The Author Email:

    DOI:10.3969/j.issn.1005-5630.2020.02.010

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