Acta Physica Sinica, Volume. 69, Issue 1, 018501-1(2020)

Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory

Yin-Hong Luo1,*... Feng-Qi Zhang1, Hong-Xia Guo1 and Hajdas Wojtek2 |Show fewer author(s)
Author Affiliations
  • 1State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an 710024, China
  • 2Paul Scherrer Institute, Villigen PSI 5232, Switzerland
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    References(22)

    [15] Amusan O A, Massengill L W, Baze M. P., Bhuva B L, Witulski A F, DasGupta S, Sternberg A L, Fleming P R, Heath C C, Alles M L[J]. IEEE Trans. Nucl. Sci., 52, 2584(2007).

    [19] European Space Agency[J]. ESCC Basic Specification NO.25100(2014).

    [21] Schwank J R, Shaneyfelt M R, Baggio J, Dodd P E, Felix J A, Ferlet-Cavrois V, Paillet P, Lambert D, Sexton F W, Hash G L, Blackmore E[J]. IEEE Trans. Nucl. Sci., 52, 2622(2006).

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    Yin-Hong Luo, Feng-Qi Zhang, Hong-Xia Guo, Hajdas Wojtek. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory[J]. Acta Physica Sinica, 2020, 69(1): 018501-1

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    Paper Information

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    Received: Jun. 6, 2019

    Accepted: --

    Published Online: Nov. 4, 2020

    The Author Email:

    DOI:10.7498/aps.69.20190878

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