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Microelectronics, Volume. 53, Issue 5, 834(2023)

A Statistic Modeling Method of Circuit Cell Delay Fluctuation at Sub-Threshold Domain

XU Ting1,2, YAN Zhenzhen1,2, LIU Hainan11,2, LI Bo1,2, QIAO Shushan1, HAN Zhengsheng1,3,4, and BU Jianhui1,2
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    XU Ting, YAN Zhenzhen, LIU Hainan1, LI Bo, QIAO Shushan, HAN Zhengsheng, BU Jianhui. A Statistic Modeling Method of Circuit Cell Delay Fluctuation at Sub-Threshold Domain[J]. Microelectronics, 2023, 53(5): 834

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    Received: Jan. 13, 2023

    Accepted: --

    Published Online: Jan. 3, 2024

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.230020

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology