Acta Optica Sinica, Volume. 38, Issue 6, 0612007(2018)

[in Chinese]

Song Ye1,2, Yongfeng Sun1,2,3, Zhiwei Li1,2, Hailiang Shi1,2、*, Wei Xiong1,2, Xinqiang Wang1,2, Jiejun Wang1,2, and Wentao Zhang1,2
Author Affiliations
  • 1 Anhui Institute of Optics and Fine Mechanics Chinese Academy of Sciences, Hefei, Anhui 230031, China
  • 1 School of Electronic Engineering and Automation Guilin University of Electronic Technology, Guilin, Guangxi 541004, China
  • 2 Anhui Institute of Optics and Fine Mechanics Chinese Academy of Sciences, Hefei, Anhui 230031, China
  • 2 Guang xi Key Laboratory of Optoelectronic Information Processing Guilin University of Electronic Technology, Guilin, Guangxi, 541004, China
  • 2 Key Laboratory of General Optical Calibration and Characterization Chinese Academyof Sciences, Hefei ,Anhui 230031, China
  • 3 Key Laboratory of General Optical Calibration and Characterization Chinese Academyof Sciences, Hefei ,Anhui 230031, China
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    Figures & Tables(9)
    Spectra recovered from interferograms with different orders. (a) The first order response; (b) the second order response; (c) the third order response; (d) the fourth order response
    Spectra recovered from nonlinear interferogram with traditional method
    Spectra recovered from nonlinear interferogram corrected with cross-iteration method
    Influence of direct current voltage deviation on correction accuracy
    Schematic of detector nonlinear correction experiment
    Spectra recovered from blackbody at different temperatures observed by detector
    Radiation spectra of blackbody before and after correction at 2200 ℃. (a) Entire spectra; (b)-(d) partial enlarged details
    Fitted curves at wavenumber of 1237.9 cm-1 before and after correction
    • Table 1. Corrected goodness R2 of undisturbed wavenumbers before and after correction

      View table

      Table 1. Corrected goodness R2 of undisturbed wavenumbers before and after correction

      Wavenumber /cm-1R2
      Before correctionSecond-order correctionThird-order correction
      1237.90.99640.99910.9996
      1253.20.99650.99880.9994
      1266.10.99430.99890.9996
      1280.10.99630.99870.9994
      1293.10.99680.99890.9995
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    Song Ye, Yongfeng Sun, Zhiwei Li, Hailiang Shi, Wei Xiong, Xinqiang Wang, Jiejun Wang, Wentao Zhang. [J]. Acta Optica Sinica, 2018, 38(6): 0612007

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    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: Dec. 29, 2017

    Accepted: --

    Published Online: Aug. 29, 2018

    The Author Email: Shi Hailiang (hlshi@aiofm.ac.cn)

    DOI:10.3788/aos201838.0612007

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