Acta Optica Sinica, Volume. 38, Issue 6, 0612007(2018)

[in Chinese]

Song Ye^1,2, Yongfeng Sun^1,2,3, Zhiwei Li^1,2, Hailiang Shi^1,2、*, Wei Xiong^1,2, Xinqiang Wang^1,2, Jiejun Wang^1,2, and Wentao Zhang^1,2

Author Affiliations

¹ Anhui Institute of Optics and Fine Mechanics Chinese Academy of Sciences, Hefei, Anhui 230031, China

¹ School of Electronic Engineering and Automation Guilin University of Electronic Technology, Guilin, Guangxi 541004, China

² Anhui Institute of Optics and Fine Mechanics Chinese Academy of Sciences, Hefei, Anhui 230031, China

² Guang xi Key Laboratory of Optoelectronic Information Processing Guilin University of Electronic Technology, Guilin, Guangxi, 541004, China

² Key Laboratory of General Optical Calibration and Characterization Chinese Academyof Sciences, Hefei ,Anhui 230031, China

³ Key Laboratory of General Optical Calibration and Characterization Chinese Academyof Sciences, Hefei ,Anhui 230031, China

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Song Ye, Yongfeng Sun, Zhiwei Li, Hailiang Shi, Wei Xiong, Xinqiang Wang, Jiejun Wang, Wentao Zhang. [J]. Acta Optica Sinica, 2018, 38(6): 0612007

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Paper Information

Category: Instrumentation, measurement, and metrology

Received: Dec. 29, 2017

Accepted: --

Published Online: Aug. 29, 2018

The Author Email: Shi Hailiang (hlshi@aiofm.ac.cn)

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