Infrared and Laser Engineering, Volume. 49, Issue 7, 20190433(2020)
Radiation effects of 0.18 μm CMOS APS by proton irradiation
Fig. 2. Comparison of the dark signal distribution between devices proton pre-and post-irradiation
Fig. 3. Dark signal defect diagram after being irradiated by proton
Fig. 4. 3D figure of dark signal hot pixel before radiation (a) and after radiation (b)
Fig. 6. Proton-induced single event transient bright cluster (a) and different shape bright lines (b), (c), (d)
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. Radiation effects of 0.18 μm CMOS APS by proton irradiation[J]. Infrared and Laser Engineering, 2020, 49(7): 20190433
Category: Optical devices
Received: Oct. 8, 2019
Accepted: --
Published Online: Sep. 17, 2020
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