High Power Laser Science and Engineering, Volume. 9, Issue 3, 03000e42(2021)
High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility
Figures & Tables(7)
Fig. 1. Schematic of the multilayer KB microscope for high-resolution Ti flash radiography.
Fig. 2. Reflectivity measurement results of the KB multilayer by the X-ray diffractometer for grazing angles of (a) 1.000° and (b) 1.046°.
Fig. 3. Spectral response curves by fitting the reflectivity measurement results of the KB multilayer for grazing angles of (a) 1.000° and (b) 1.046°.
Fig. 4. Alignment parts of the multilayer KB microscope based on dual simulated balls.
Fig. 5. (a) Spatial resolution testing image and (b) calibrated result of the 600-mesh Au grid backlighted by a copper X-ray tube.
Fig. 6. Test result of the KB microscope by Ti flash radiography of the indirect-driven gold cone target.
Table 1. Optical parameters of the multilayer KB microscope.
View tableView in ArticleTable 1. Optical parameters of the multilayer KB microscope.
Direction R (m) d (mm) θ u (mm) v (mm) M Meridional Sagittal 19.5 10 1.000° 187.2 1872 10 1.046° 197.2 1862 9.44
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Shengzhen Yi, Feng Zhang, Qiushi Huang, Lai Wei, Yuqiu Gu, Zhanshan Wang. High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility[J]. High Power Laser Science and Engineering, 2021, 9(3): 03000e42
Paper Information
Category: Research Articles
Received: Mar. 8, 2021
Accepted: May. 17, 2021
Published Online: Jul. 27, 2021
The Author Email: Zhanshan Wang (wangzs@tongji.edu.cn)
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