Journal of Infrared and Millimeter Waves, Volume. 44, Issue 1, 1(2025)

The influence of V/III ratio on electron mobility of the InAsxSb1-x layers grown on GaAs substrate by molecular beam epitaxy

Jing ZHANG1,*... Zhi YANG1, Li-Ming ZHENG2, Xiao-Juan ZHU1, Ping WANG1 and Lin YANG3 |Show fewer author(s)
Author Affiliations
  • 1School of Electronic Information and Artificial Intelligence,Shaanxi University of Science and Technology,Xi’an 710016,China
  • 2School of Mechanical and Electrical Engineering,Xi’an Traffic Engineering Institute,Xi’an 710300,China
  • 3School of Information Science and Engineering,Hebei University of Science and Technology,Shijiazhuang 050018,China
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    References(27)

    [12] V A Kumar, P Anandan. Analysis & Simulation of InSb HEMT Device for Low Power and Switching Applications(2015).

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    Jing ZHANG, Zhi YANG, Li-Ming ZHENG, Xiao-Juan ZHU, Ping WANG, Lin YANG. The influence of V/III ratio on electron mobility of the InAsxSb1-x layers grown on GaAs substrate by molecular beam epitaxy[J]. Journal of Infrared and Millimeter Waves, 2025, 44(1): 1

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    Paper Information

    Category: Infrared Physics, Materials and Devices

    Received: Jan. 20, 2024

    Accepted: --

    Published Online: Mar. 5, 2025

    The Author Email: ZHANG Jing (zhangjing6048@126.com)

    DOI:10.11972/j.issn.1001-9014.2025.01.001

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