Electronics Optics & Control, Volume. 26, Issue 7, 75(2019)
A Remaining Useful Lifetime Prediction Method for Stochastic Degradation Device Under Accelerated Stress
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XIE Jiang, CAI Zhongyi, WANG Zezhou, LI Shanshan. A Remaining Useful Lifetime Prediction Method for Stochastic Degradation Device Under Accelerated Stress[J]. Electronics Optics & Control, 2019, 26(7): 75
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Received: Jul. 16, 2018
Accepted: --
Published Online: Jan. 6, 2021
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