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Electronics Optics & Control, Volume. 26, Issue 7, 75(2019)

A Remaining Useful Lifetime Prediction Method for Stochastic Degradation Device Under Accelerated Stress

XIE Jiang1... CAI Zhongyi2, WANG Zezhou2 and LI Shanshan2 |Show fewer author(s)
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    XIE Jiang, CAI Zhongyi, WANG Zezhou, LI Shanshan. A Remaining Useful Lifetime Prediction Method for Stochastic Degradation Device Under Accelerated Stress[J]. Electronics Optics & Control, 2019, 26(7): 75

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    Received: Jul. 16, 2018

    Accepted: --

    Published Online: Jan. 6, 2021

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2019.07.015

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology