Spectroscopy and Spectral Analysis, Volume. 36, Issue 12, 4039(2016)
Study of the Impact of Sample Thickness on Thin Film Method X-Ray Fluorescence Spectrum Measurement
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GAN Ting-ting, ZHANG Yu-jun, ZHAO Nan-jing, YIN Gao-fang, XIAO Xue, ZHANG Wei, LIU Jian-guo, LIU Wen-qing. Study of the Impact of Sample Thickness on Thin Film Method X-Ray Fluorescence Spectrum Measurement[J]. Spectroscopy and Spectral Analysis, 2016, 36(12): 4039
Paper Information
Received: Aug. 18, 2015
Accepted: --
Published Online: Dec. 30, 2016
The Author Email: Ting-ting GAN (tingtinggan@163.com)
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