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Spectroscopy and Spectral Analysis, Volume. 36, Issue 12, 4039(2016)

Study of the Impact of Sample Thickness on Thin Film Method X-Ray Fluorescence Spectrum Measurement

GAN Ting-ting1...2,*, ZHANG Yu-jun1, ZHAO Nan-jing1, YIN Gao-fang1, XIAO Xue1, ZHANG Wei3, LIU Jian-guo1 and LIU Wen-qing1 |Show fewer author(s)
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  • 3[in Chinese]
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    GAN Ting-ting, ZHANG Yu-jun, ZHAO Nan-jing, YIN Gao-fang, XIAO Xue, ZHANG Wei, LIU Jian-guo, LIU Wen-qing. Study of the Impact of Sample Thickness on Thin Film Method X-Ray Fluorescence Spectrum Measurement[J]. Spectroscopy and Spectral Analysis, 2016, 36(12): 4039

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    Paper Information

    Received: Aug. 18, 2015

    Accepted: --

    Published Online: Dec. 30, 2016

    The Author Email: Ting-ting GAN (tingtinggan@163.com)

    DOI:10.3964/j.issn.1000-0593(2016)12-4039-06

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology