Lifetime prediction method for high-power laser diodes under double-stress cross-step accelerated degradation test

Yeqi Zhang; Zhenfu Wang; Te Li; Lang Chen; Jiachen Zhang; Shunhua Wu; Jiachen Liu; Guowen Yang

doi:10.3788/IRLA20220592

Infrared and Laser Engineering, Volume. 52, Issue 5, 20220592(2023)

Lifetime prediction method for high-power laser diodes under double-stress cross-step accelerated degradation test

Yeqi Zhang^1,2, Zhenfu Wang¹, Te Li¹, Lang Chen¹, Jiachen Zhang¹, Shunhua Wu^1,2, Jiachen Liu^1,2, and Guowen Yang¹

¹State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China

²University of Chinese Academy of Sciences, Beijing 100049, China

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Fig. 1. Overall solution for lifetime prediction of laser diode

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Fig. 2. Schematic diagram of the change in stress conditions for the cross-step accelerated degradation test

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Fig. 3. Conversion relation between and the degradation track under each stress condition 与各个应力条件下的退化轨迹的换算关系

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Fig. 4. Photo of experimental 830 nm F-mount single-emitter device

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Fig. 5. Schematic diagram of 830 nm F-mount single-emitter devices accelerated test platform

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Fig. 6. Performance degradation data of 830 nm F-mount single-emitter devices

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Fig. 7. Failure data points were fitted with the curve of Weibull distribution function and the fit was 92.24%. (a) Estimation results of the Weibull plot after coordinate transformation; (b) Fitting results of the failure distribution function

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Table 1. Accelerated degradation test data of 830 nm F-mount single-emitter devices under different stress conditions (optical output power/W)

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Table 1. Accelerated degradation test data of 830 nm F-mount single-emitter devices under different stress conditions (optical output power/W)

Stress condition	Time/h	1#	2#	3#	4#	5#	6#	7#	8#	9#	10#	11#	12#
A[22 ℃，1.4 A]	100	1.43	1.38	1.39	1.41	1.41	1.40	1.36	1.42	1.44	1.36	1.45	1.39
	200	1.42	1.38	1.40	1.40	1.40	1.38	1.37	1.43	1.42	1.36	1.44	1.37
	300	1.39	1.37	1.37	1.39	1.38	1.35	1.41	1.39	1.39	1.34	1.43	1.34
	400	1.40	1.33	1.35	1.40	1.40	1.34	1.34	1.40	1.37	1.35	1.40	1.34
B[42 ℃，1.4 A]	500	1.36	1.33	1.33	1.37	1.38	1.30	1.29	1.36	1.31	1.31	1.36	1.29
	600	1.32	1.30	1.29	1.34	1.32	1.27	1.32	1.33	1.28	1.28	1.36	1.31
	700	1.28	1.30	1.31	1.34	1.34	1.27	1.29	1.31	1.30	1.27	1.35	1.25
	800	1.30	1.29	1.30	1.33	1.30	1.26	1.25	1.30	1.29	1.23	1.31	1.26
C[42 ℃，1.8 A]	900	1.62	1.63	1.62	1.70	1.69	1.64	1.69	1.72	1.70	1.60	1.69	1.69
	1000	1.57	1.60	1.59	1.65	1.65	1.60	1.67	1.65	1.68	1.57	1.67	1.69
	1100	1.55	1.58	1.50	1.64	1.60	1.57	1.62	1.61	1.61	1.53	1.60	1.63
	1200	1.50	1.51	1.52	1.58	1.58	1.50	1.56	1.62	1.57	1.54	1.60	1.56
D[62 ℃，1.8 A]	1300	1.39	1.44	1.43	1.50	1.45	1.39	1.52	1.50	1.47	1.40	1.49	1.42
	1400	1.35	1.37	1.38	1.44	1.41	1.33	1.45	1.44	1.40	1.35	1.45	1.41
	1500	1.27	1.34	1.33	1.41	1.34	1.31	1.43	1.41	1.35	1.32	1.36	1.35
	1600	1.26	1.28	1.27	1.36	1.26	1.25	1.38	1.39	1.29	1.30	1.30	1.30

Table 2. Degradation rate of each laser diode at each stress condition

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Table 2. Degradation rate of each laser diode at each stress condition

Laser diode ID	β_{22 ℃，1.4 A}	β_{42 ℃，1.4 A}	β_{42 ℃，1.8 A}	β_{62 ℃，1.8 A}
1	$ 9.152\times {10}^{-5} $	$ 1.358\times {10}^{-4} $	$ 2.711\times {10}^{-4} $	$ 3.674\times {10}^{-4} $
2	$ 9.245\times {10}^{-5} $	$ 1.367\times {10}^{-4} $	$ 2.613\times {10}^{-4} $	$ 3.624\times {10}^{-4} $
3	$ 8.167\times {10}^{-5} $	$ 1.251\times {10}^{-4} $	$ 2.420\times {10}^{-4} $	$ 3.635\times {10}^{-4} $
4	$ 8.321\times {10}^{-5} $	$ 1.242\times {10}^{-4} $	$ 2.338\times {10}^{-4} $	$ 3.137\times {10}^{-4} $
5	$ 8.905\times {10}^{-5} $	$ 1.337\times {10}^{-4} $	$ 2.566\times {10}^{-4} $	$ 3.893\times {10}^{-4} $
6	$ 9.458\times {10}^{-5} $	$ 1.415\times {10}^{-4} $	$ 2.805\times {10}^{-4} $	$ 3.684\times {10}^{-4} $
7	$ 7.345\times {10}^{-5} $	$ 1.097\times {10}^{-4} $	$ 2.089\times {10}^{-4} $	$ 3.259\times {10}^{-4} $
8	$ 7.563\times {10}^{-5} $	$ 1.124\times {10}^{-4} $	$ 2.073\times {10}^{-4} $	$ 3.126\times {10}^{-4} $
9	$ 9.011\times {10}^{-5} $	$ 1.344\times {10}^{-4} $	$ 2.569\times {10}^{-4} $	$ 3.698\times {10}^{-4} $
10	$ 8.583\times {10}^{-5} $	$ 1.261\times {10}^{-4} $	$ 2.372\times {10}^{-4} $	$ 3.521\times {10}^{-4} $
11	$ 9.774\times {10}^{-5} $	$ 1.440\times {10}^{-4} $	$ 2.719\times {10}^{-4} $	$ 3.973\times {10}^{-4} $
12	$ 9.804\times {10}^{-5} $	$ 1.464\times {10}^{-4} $	$ 2.878\times {10}^{-4} $	$ 3.868\times {10}^{-4} $

Table 3. Parameters of the accelerated degradation model obtained by taking two sets of single-emitter 1 and single-emitter 2 (a total of 8 degradation rate data)
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Table 3. Parameters of the accelerated degradation model obtained by taking two sets of single-emitter 1 and single-emitter 2 (a total of 8 degradation rate data)
$ a $ $ b $ $ c $ $ d $
4.40 1 830 −1.66 −3.36

Table 4. Accelerated degradation model parameters corresponding to each laser diode and extrapolated lifetime

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Table 4. Accelerated degradation model parameters corresponding to each laser diode and extrapolated lifetime

Laser diode ID	a	b	c	ε_{22 ℃，0.9 A}/h
1	4.01	1 833	−1.73	5805
2	3.90	1 816	−1.62	5420
3	3.51	1 981	−1.65	6249
4	3.80	1 862	−1.58	5942
5	3.73	1 880	−1.63	5630
6	3.81	1 873	−1.71	5542
7	3.95	1 865	−1.61	6789
8	3.89	1 841	−1.53	6334
9	3.79	1 856	−1.62	5561
10	4.02	1 786	−1.58	5722
11	3.85	1 799	−1.59	5001
12	3.81	1 853	−1.69	5273

Table 5. Comparison of the theoretical degradation rate β_test calculated by the model with the actual degradation rate β_{62 ℃，1.8 A}

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Table 5. Comparison of the theoretical degradation rate β_test calculated by the model with the actual degradation rate β_{62 ℃，1.8 A}

Laser diode ID	β_{62 ℃，1.8 A}	β_test	Error
1	$ 3.674\times 1{0}^{-4} $	$ 3.837\times 1{0}^{-4} $	$ 4.44\text{%} $
2	$ 3.624\times 1{0}^{-4} $	$ 3.686\times 1{0}^{-4} $	$ 1.02\text{%} $
3	$ 3.635\times 1{0}^{-4} $	$ 3.522\times 1{0}^{-4} $	$ 3.11\text{%} $
4	$ 3.137\times 1{0}^{-4} $	$ 3.328\times 1{0}^{-4} $	$ 6.09\text{%} $
5	$ 3.893\times 1{0}^{-4} $	$ 3.657\times 1{0}^{-4} $	$ 6.09\text{%} $
6	$ 3.684\times 1{0}^{-4} $	$ 4.001\times 1{0}^{-4} $	$ 8.60\text{%} $
7	$ 3.259\times 1{0}^{-4} $	$ 2.975\times 1{0}^{-4} $	$ 8.71\text{%} $
8	$ 3.126\times 1{0}^{-4} $	$ 2.939\times 1{0}^{-4} $	$ 5.98\text{%} $
9	$ 3.698\times 1{0}^{-4} $	$ 3.651\times 1{0}^{-4} $	$ 1.27\text{%} $
10	$ 3.521\times 1{0}^{-4} $	$ 3.327\times 1{0}^{-4} $	$ 5.51\text{%} $
11	$ 3.973\times 1{0}^{-4} $	$ 3.824\times 1{0}^{-4} $	$ 3.75\text{%} $
12	$ 3.868\times 1{0}^{-4} $	$ 4.097\times 1{0}^{-4} $	$ 5.92\text{%} $

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Yeqi Zhang, Zhenfu Wang, Te Li, Lang Chen, Jiachen Zhang, Shunhua Wu, Jiachen Liu, Guowen Yang. Lifetime prediction method for high-power laser diodes under double-stress cross-step accelerated degradation test[J]. Infrared and Laser Engineering, 2023, 52(5): 20220592

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Paper Information

Category: Laser & laser optics

Received: Aug. 17, 2022

Accepted: --

Published Online: Jul. 4, 2023

The Author Email:

DOI:10.3788/IRLA20220592

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

Table 1. Accelerated degradation test data of 830 nm F-mount single-emitter devices under different stress conditions (optical output power/W)

Table 1. Accelerated degradation test data of 830 nm F-mount single-emitter devices under different stress conditions (optical output power/W)

Table 2. Degradation rate of each laser diode at each stress condition

Table 2. Degradation rate of each laser diode at each stress condition

Table 3. Parameters of the accelerated degradation model obtained by taking two sets of single-emitter 1 and single-emitter 2 (a total of 8 degradation rate data)

Table 3. Parameters of the accelerated degradation model obtained by taking two sets of single-emitter 1 and single-emitter 2 (a total of 8 degradation rate data)

Table 4. Accelerated degradation model parameters corresponding to each laser diode and extrapolated lifetime

Table 4. Accelerated degradation model parameters corresponding to each laser diode and extrapolated lifetime

Table 5. Comparison of the theoretical degradation rate βtest calculated by the model with the actual degradation rate β62 ℃，1.8 A

Table 5. Comparison of the theoretical degradation rate βtest calculated by the model with the actual degradation rate β62 ℃，1.8 A

Table 5. Comparison of the theoretical degradation rate β_test calculated by the model with the actual degradation rate β_{62 ℃，1.8 A}

Table 5. Comparison of the theoretical degradation rate β_test calculated by the model with the actual degradation rate β_{62 ℃，1.8 A}