Infrared and Laser Engineering, Volume. 48, Issue 2, 204004(2019)

Algorithm for defect segmentation in infrared nondestructive testing based on robust Otsu

Wang Zijun*, Qiu Yanrui, Yang Hongxiao, and Sun Lei
Author Affiliations
  • [in Chinese]
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    References(10)

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    Wang Zijun, Qiu Yanrui, Yang Hongxiao, Sun Lei. Algorithm for defect segmentation in infrared nondestructive testing based on robust Otsu[J]. Infrared and Laser Engineering, 2019, 48(2): 204004

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    Paper Information

    Category: 红外技术及应用

    Received: Sep. 10, 2018

    Accepted: Oct. 11, 2018

    Published Online: Apr. 5, 2019

    The Author Email: Zijun Wang (wangzijun@uestc.edu.cn)

    DOI:10.3788/irla201948.0204004

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