Infrared and Laser Engineering, Volume. 48, Issue 2, 204004(2019)
Algorithm for defect segmentation in infrared nondestructive testing based on robust Otsu
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Wang Zijun, Qiu Yanrui, Yang Hongxiao, Sun Lei. Algorithm for defect segmentation in infrared nondestructive testing based on robust Otsu[J]. Infrared and Laser Engineering, 2019, 48(2): 204004
Paper Information
Category: 红外技术及应用
Received: Sep. 10, 2018
Accepted: Oct. 11, 2018
Published Online: Apr. 5, 2019
The Author Email: Zijun Wang (wangzijun@uestc.edu.cn)
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