Spectroscopy and Spectral Analysis, Volume. 44, Issue 11, 3120(2024)

Fabrication and Characterization of Multilayer Analyzer Crystals for X-Ray Fluorescence Analysis on Light Elements

WANG Zi-le... ZHANG Zhe*, ZHANG Yun-xue, XIANG Si-meng, WEI Zhen-bo, WEN Sheng-you and WANG Zhan-shan |Show fewer author(s)
Author Affiliations
  • Institute of Precision Optical Engineering, MOE Key Laboratory of Advanced Micro-Structured Materials, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
  • show less
    References(16)

    [2] [2] Amosova A A, Chubarov V M, Pashkova G V, et al. Applied Radiation and Isotopes, 2019, 144(1): 118.

    [3] [3] Pandey A, Dhara S, Khan F A, et al. Journal of Radioanalytical and Nuclear Chemistry, 2019, 319(3): 775.

    [5] [5] Lider V V. Physics-Uspekhi, 2019, 62(11): 1063.

    [7] [7] Hertlein F, Kroth S, Wiesmann J, et al. Advanced Engineering Materials, 2009, 10(7): 686.

    [8] [8] https://incoatec.de/optics.html

    [9] [9] https://docplayer.pub/docs/827bd_introduction-to-x-ray-fluorescence-xrf.html

    [10] [10] Platonov Y Y, Gomez L, Broadway D. Proceedings of SPIE, 2002, 4782: 152.

    [11] [11] Andr J M, Jonnard P, Michaelsen C, et al. X-Ray Spectrometry, 2005, 34(3): 203.

    [12] [12] IJpes D, Yakshin A E, Sturm J M, et al. Journal of Applied Physics, 2023, 133(2): 025302.

    [13] [13] Spiller E. Soft X-Ray Optics. SPIE Optical Engineering Press, 1994.

    [14] [14] Windt D L. Computers in Physics, 1998, 12(4): 360.

    [18] [18] Li H C, Zhu J T, Wang Z S, et al. Optical Materials Express, 2013, 3(5): 546.

    [19] [19] Tu Y C, Zhu J T, Li H C, et al. Applied Surface Science, 2014, 313(1): 341.

    [20] [20] Polkovnikov V N, Garakhin S A, Kvashennikov D S, et al. Technical Physics, 2020, 65(11): 1809.

    [21] [21] Singam P S, Nayak M, Gupta R, et al. Journal of Astronomical Telescopes, Instruments, and Systems, 2018, 4(4): 044003.

    [22] [22] Pradhan P C, Majhi A, Nayak M. Journal of Applied Physics, 2018, 123(9): 095302.

    Tools

    Get Citation

    Copy Citation Text

    WANG Zi-le, ZHANG Zhe, ZHANG Yun-xue, XIANG Si-meng, WEI Zhen-bo, WEN Sheng-you, WANG Zhan-shan. Fabrication and Characterization of Multilayer Analyzer Crystals for X-Ray Fluorescence Analysis on Light Elements[J]. Spectroscopy and Spectral Analysis, 2024, 44(11): 3120

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Received: Sep. 28, 2023

    Accepted: Jan. 16, 2025

    Published Online: Jan. 16, 2025

    The Author Email: Zhe ZHANG (zzgight@tongji.edu.cn)

    DOI:10.3964/j.issn.1000-0593(2024)11-3120-08

    Topics