Fabrication and Characterization of Multilayer Analyzer Crystals for X-Ray Fluorescence Analysis on Light Elements

WANG Zi-le; ZHANG Zhe; ZHANG Yun-xue; XIANG Si-meng; WEI Zhen-bo; WEN Sheng-you; WANG Zhan-shan

doi:10.3964/j.issn.1000-0593(2024)11-3120-08

Spectroscopy and Spectral Analysis, Volume. 44, Issue 11, 3120(2024)

Fabrication and Characterization of Multilayer Analyzer Crystals for X-Ray Fluorescence Analysis on Light Elements

WANG Zi-le... ZHANG Zhe*, ZHANG Yun-xue, XIANG Si-meng, WEI Zhen-bo, WEN Sheng-you and WANG Zhan-shan |Show fewer author(s)

Author Affiliations

Institute of Precision Optical Engineering, MOE Key Laboratory of Advanced Micro-Structured Materials, School of Physics Science and Engineering, Tongji University, Shanghai　200092, China

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WANG Zi-le, ZHANG Zhe, ZHANG Yun-xue, XIANG Si-meng, WEI Zhen-bo, WEN Sheng-you, WANG Zhan-shan. Fabrication and Characterization of Multilayer Analyzer Crystals for X-Ray Fluorescence Analysis on Light Elements[J]. Spectroscopy and Spectral Analysis, 2024, 44(11): 3120

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Paper Information

Received: Sep. 28, 2023

Accepted: Jan. 16, 2025

Published Online: Jan. 16, 2025

The Author Email: Zhe ZHANG (zzgight@tongji.edu.cn)

DOI:10.3964/j.issn.1000-0593(2024)11-3120-08

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

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