Optics and Precision Engineering, Volume. 26, Issue 1, 1(2018)

Calibration method of silicon 〈111〉 orientation and its application in fabrication of silicon grating by anisotropic wet etching

LIANG Ju-xi1、*, ZHENG Yan-chang2, QIU Ke-qiang1, LIU Zheng-kun1, XU Xiang-dong1, and HONG Yi-lin1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(19)

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    [11] [11] AHN M, HEILMANN R K, SCHATTENBURG M L. Fabrication of 200 nm period blazed transmission gratings on silicon-on-insulator wafers [J]. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2008, 26(6): 2179-2182.

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    LIANG Ju-xi, ZHENG Yan-chang, QIU Ke-qiang, LIU Zheng-kun, XU Xiang-dong, HONG Yi-lin. Calibration method of silicon 〈111〉 orientation and its application in fabrication of silicon grating by anisotropic wet etching[J]. Optics and Precision Engineering, 2018, 26(1): 1

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    Paper Information

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    Received: Aug. 23, 2017

    Accepted: --

    Published Online: Mar. 14, 2018

    The Author Email: Ju-xi LIANG (timljx00@163.com)

    DOI:10.3788/ope.20182601.0001

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