Optics and Precision Engineering, Volume. 26, Issue 1, 1(2018)
Calibration method of silicon 〈111〉 orientation and its application in fabrication of silicon grating by anisotropic wet etching
Gratings with many types of groove profiles such as rectangles and triangles can be fabricated by wet etching silicon, during which a key step is to accurately align the grating line of the mask with the 〈111〉 orientation of silicon. Sidewall roughness can be visibly reduced by high-precision alignment, which is necessary for the fabrication of large grating structures. A fanned alignment pattern was designed and fabricated, which was then etched to accurately determine the 〈111〉 orientation of silicon. After determining the 〈111〉 orientation, a grating with a height of 48.3 μm, period of 5 μm, and area of 15 mm×15 mm was fabricated successfully by ultraviolet lithography and wet etching. The aspect ratio of the grating was approximately 20, and the roughness of the lines sidewalls was 0.404 nm. A rectangular grating with a large aspect ratio and a triangular-grooved grating were fabricated successfully with holographic lithography and wet etching. The rectangular grating was 4.8 μm tall with a period of 333 nm and an area of 50 mm×60 mm. Its aspect ratio was approximately 100 with a sidewall roughness of 0.267 nm. The period of the V-groove grating was 2.5 μm, and its sidewall roughness was 0.406 nm.
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LIANG Ju-xi, ZHENG Yan-chang, QIU Ke-qiang, LIU Zheng-kun, XU Xiang-dong, HONG Yi-lin. Calibration method of silicon 〈111〉 orientation and its application in fabrication of silicon grating by anisotropic wet etching[J]. Optics and Precision Engineering, 2018, 26(1): 1
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Received: Aug. 23, 2017
Accepted: --
Published Online: Mar. 14, 2018
The Author Email: Ju-xi LIANG (timljx00@163.com)