Opto-Electronic Engineering, Volume. 42, Issue 1, 20(2015)
The Research of Data Compensation Method for V-prism Test of High Refractive Index
[1] [1] GAO Bilie. The Measurement Means by Optical Knowledge [M]. Beijing:The Educational Department of Chinese Science Institute,1989.
[2] [2] SUN Guilin. The Systematic Analysis for Test Deviation of Glass Refractive Index by V-prism Method [J]. The Brief of the Xi′an Institute of Technology,1985(1):12-16.
[3] [3] MA Botao,LIN Jianghai. A Method to Improve Measuring Accuracy by V-prism Instrument [J]. Optics Mechanics,1990(3): 21-24.
[4] [4] The State Department for Making Standard GB7962.11-2010. The measurement Methods for Colorless Optical Glass:The Accurate measurement Method for Refractive Index [S]. 2010.
[5] [5] SHEN Hailong,YANG Guanming. The Analysis for V-prism Instrument Testing Deviation and How to Apply it Correctly [J]. The Technology of Yunnan Optics,1991(2):13-18.
[6] [6] LIN Jiaming,SU Datu. High Accuracy Measurement Technique for Refractive Index and Dispersion of optical Material [J]. Optical Technique,1990(1):6-12.
[7] [7] JIANG Anming,WANG Xiaoqin,LI Jing. Study on the Methods of Optical Parameter Measurement [J]. Optical Technique, 1997(1):5-8.
Get Citation
Copy Citation Text
WU Delin, WU Zhiqiang, MA Botao, SU Yong, MA Zhiyuan. The Research of Data Compensation Method for V-prism Test of High Refractive Index[J]. Opto-Electronic Engineering, 2015, 42(1): 20
Category:
Received: Mar. 28, 2014
Accepted: --
Published Online: Jan. 26, 2015
The Author Email: Delin WU (wudelincs@126.com)