Opto-Electronic Engineering, Volume. 42, Issue 1, 20(2015)

The Research of Data Compensation Method for V-prism Test of High Refractive Index

WU Delin*... WU Zhiqiang, MA Botao, SU Yong and MA Zhiyuan |Show fewer author(s)
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    WU Delin, WU Zhiqiang, MA Botao, SU Yong, MA Zhiyuan. The Research of Data Compensation Method for V-prism Test of High Refractive Index[J]. Opto-Electronic Engineering, 2015, 42(1): 20

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    Paper Information

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    Received: Mar. 28, 2014

    Accepted: --

    Published Online: Jan. 26, 2015

    The Author Email: Delin WU (wudelincs@126.com)

    DOI:10.3969/j.issn.1003-501x.2015.01.004

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