Opto-Electronic Engineering, Volume. 42, Issue 1, 20(2015)
The Research of Data Compensation Method for V-prism Test of High Refractive Index
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WU Delin, WU Zhiqiang, MA Botao, SU Yong, MA Zhiyuan. The Research of Data Compensation Method for V-prism Test of High Refractive Index[J]. Opto-Electronic Engineering, 2015, 42(1): 20
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Received: Mar. 28, 2014
Accepted: --
Published Online: Jan. 26, 2015
The Author Email: Delin WU (wudelincs@126.com)