High Power Laser and Particle Beams, Volume. 36, Issue 8, 089003(2024)
Measurement of two-dimensional high-frequency motion displacement of piezoelectric shear stack using atomic force microscope tapping trajectories
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Ruonan Yin, Bo Xue, Jinming Zhang, Zhe Wu. Measurement of two-dimensional high-frequency motion displacement of piezoelectric shear stack using atomic force microscope tapping trajectories[J]. High Power Laser and Particle Beams, 2024, 36(8): 089003
Category: Advanced Interdisciplinary Science
Received: Oct. 23, 2023
Accepted: Dec. 3, 2024
Published Online: Aug. 8, 2024
The Author Email: Xue Bo (xuebo@nefu.edu.cn)