High Power Laser and Particle Beams, Volume. 36, Issue 8, 089003(2024)

Measurement of two-dimensional high-frequency motion displacement of piezoelectric shear stack using atomic force microscope tapping trajectories

Ruonan Yin... Bo Xue*, Jinming Zhang and Zhe Wu |Show fewer author(s)
Author Affiliations
  • College of Mechanical and Electrical Engineering, Northeast Forestry University, Harbin 150040, China
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    References(14)

    [2] [2] Uchino K. The development of piezoelectric materials the new perspective[M]Uchino K. Advanced Piezoelectric Materials: Science Technology. 2nd ed. Duxfd, United Kingdom: Woodhead Publishing, 2017: 192.

    [7] Li Huipeng, Tang Ruoxiang, Lv Yaning. Research on precision piezoelectric micro-displacement system based on capacitance sensor[J]. Semiconductor Optoelectronics, 39, 146-150(2018).

    [11] Qi Yanqiang, Zhao Xiaodan, Li Mengyang. Optical interference measurement and control system of piezoelectric ceramic micro-displacement[J]. Journal of Taiyuan University of Technology, 49, 612-616(2018).

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    Ruonan Yin, Bo Xue, Jinming Zhang, Zhe Wu. Measurement of two-dimensional high-frequency motion displacement of piezoelectric shear stack using atomic force microscope tapping trajectories[J]. High Power Laser and Particle Beams, 2024, 36(8): 089003

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    Paper Information

    Category: Advanced Interdisciplinary Science

    Received: Oct. 23, 2023

    Accepted: Dec. 3, 2024

    Published Online: Aug. 8, 2024

    The Author Email: Xue Bo (xuebo@nefu.edu.cn)

    DOI:10.11884/HPLPB202436.230351

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