Optics and Precision Engineering, Volume. 16, Issue 4, 565(2008)
X-ray photoelectron spectroscopy of Ge1-xCx thin films prepared by RLVIP technique
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. X-ray photoelectron spectroscopy of Ge1-xCx thin films prepared by RLVIP technique[J]. Optics and Precision Engineering, 2008, 16(4): 565
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