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Optics and Precision Engineering, Volume. 16, Issue 4, 565(2008)

X-ray photoelectron spectroscopy of Ge1-xCx thin films prepared by RLVIP technique

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. X-ray photoelectron spectroscopy of Ge1-xCx thin films prepared by RLVIP technique[J]. Optics and Precision Engineering, 2008, 16(4): 565

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    Received: Aug. 9, 2007

    Accepted: --

    Published Online: Aug. 17, 2008

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology