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Laser & Optoelectronics Progress, Volume. 58, Issue 10, 1011004(2021)

Progress in Weak-Value-Based Quantum Metrology and Tomography

Liang Xu and Lijian Zhang*
Author Affiliations
  • National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Manipulation, Collaborative Innovation Center of Advanced Microstructures, and College of Engineering and Applied Sciences, Nanjing University, Nanjing, Jiangsu 210093, China
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    Schematic for the weak-value amplification

    Fig. 1. Schematic for the weak-value amplification

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    General procedure of quantum metrology

    Fig. 2. General procedure of quantum metrology

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    Liang Xu, Lijian Zhang. Progress in Weak-Value-Based Quantum Metrology and Tomography[J]. Laser & Optoelectronics Progress, 2021, 58(10): 1011004

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    Paper Information

    Category: Imaging Systems

    Received: Apr. 8, 2021

    Accepted: Apr. 23, 2021

    Published Online: May. 28, 2021

    The Author Email: Zhang Lijian (lijian.zhang@nju.edu.cn)

    DOI:10.3788/LOP202158.1011004

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology