Laser & Optoelectronics Progress, Volume. 54, Issue 6, 63001(2017)
Measurement of Trace Moisture Based on Integrated Cavity at 1392 nm with High Sensitivity
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Xu Dong, Wu Tao, He Xingdao, Fang Hui. Measurement of Trace Moisture Based on Integrated Cavity at 1392 nm with High Sensitivity[J]. Laser & Optoelectronics Progress, 2017, 54(6): 63001
Category: Spectroscopy
Received: Jan. 7, 2017
Accepted: --
Published Online: Jun. 8, 2017
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