Journal of Semiconductors, Volume. 45, Issue 11, 112502(2024)

First demonstration of a self-aligned p-channel GaN back gate injection transistor

Yingjie Wang1,2, Sen Huang1,2、*, Qimeng Jiang1,2、**, Jiaolong Liu1,2, Xinhua Wang1,2, Wen Liu3, Liu Wang1,2, Jingyuan Shi1, Jie Fan1, Xinguo Gao1, Haibo Yin1, Ke Wei1, and Xinyu Liu1,2
Author Affiliations
  • 1High-Frequency High-Voltage Device and Integrated Circuits Research and Development Center, Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China
  • 2School of Integrated Circuits, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3China School of Advanced Technology, Xi'an Jiaotong–Liverpool University, Suzhou 215123, China
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    Yingjie Wang, Sen Huang, Qimeng Jiang, Jiaolong Liu, Xinhua Wang, Wen Liu, Liu Wang, Jingyuan Shi, Jie Fan, Xinguo Gao, Haibo Yin, Ke Wei, Xinyu Liu. First demonstration of a self-aligned p-channel GaN back gate injection transistor[J]. Journal of Semiconductors, 2024, 45(11): 112502

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    Paper Information

    Category: Research Articles

    Received: May. 17, 2024

    Accepted: --

    Published Online: Dec. 23, 2024

    The Author Email: Huang Sen (SHuang), Jiang Qimeng (QMJiang)

    DOI:10.1088/1674-4926/24050027

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