[1] [1] Jamieson J C, Lawson A W, Nachtrieb N D. Review of Scientific Instrument, 1959, 30: 1016.

[2] [2] Dunstan D J, Scherrer W. Review of Scientific Instrument, 1988, 59(4): 627.

[3] [3] Bassett W A, Shen A W, Bucknum M, et al. Pure and Applied Geophysics, 1993, 141(2-4): 487.

[4] [4] Silvera I F. Review of Scientific Instrument, 1999, 70(12): 4609.

[5] [5] Evans W J, Yoo C S, Lee G W, et al. Review of Scientific Instrument, 2007, 78(7): 073904.1.

[6] [6] Shinoda K, Noguchi N. Rev. Review of Scientific Instrument, 2008, 79(015101): 1.

[7] [7] Mao H K, Xu J, Bell P M J. Journal of Geophysical Research, 1986, 91(B5): 4673.

[8] [8] Bassett W A, Shen A W, Bucknum M. Review of Scientific Instrument, 1993, 64: 2340.

[9] [9] Christian S, Martin A Z. American Mineralogist, 2000, 85: 1725.

[10] [10] Kaltsas G, Nassiopoulos A G. Microelectronic Engineering, 1997, 35(1-4): 397.

[11] [11] Ingrid D W. Semiconductor Science and Technology, 1996, 11(2): 139.

[12] [12] Ingrid D W. Journal of Raman Spectroscopy, 1999, 30(10): 877.