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Laser & Optoelectronics Progress, Volume. 49, Issue 12, 121201(2012)

Polarized Light Reflection Method for Measuring Thin Film Parameters

Zhou Jinzhao*, Yu Wenfang, and Huang Zuohua
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    Zhou Jinzhao, Yu Wenfang, Huang Zuohua. Polarized Light Reflection Method for Measuring Thin Film Parameters[J]. Laser & Optoelectronics Progress, 2012, 49(12): 121201

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 8, 2012

    Accepted: --

    Published Online: Oct. 19, 2012

    The Author Email: Jinzhao Zhou (zzzhoujinzhao@126.com)

    DOI:10.3788/lop49.121201

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology