Photonics Research, Volume. 7, Issue 7, B36(2019)

Current-induced degradation and lifetime prediction of 310  nm ultraviolet light-emitting diodes

Jan Ruschel1、*, Johannes Glaab1, Batoul Beidoun1, Neysha Lobo Ploch1, Jens Rass1, Tim Kolbe1, Arne Knauer1, Markus Weyers1, Sven Einfeldt1, and Michael Kneissl1,2
Author Affiliations
  • 1Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
  • 2Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstr. 36, EW 6-1, 10623 Berlin, Germany
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    Figures & Tables(6)
    Representative emission spectra of the investigated 310 nm UV LEDs normalized to the emission peak. The spectra were measured at 100 mA at a heat sink temperature of 25°C before aging and after aging experiment 3 (Table 1).
    Optical power over time of LEDs run at different current densities. The values are normalized to the initial value and averaged over 15 LEDs. For all currents, the junction temperature was kept at (90±5)°C.
    Operation time at which the optical power has reduced to 70% (t70%) of the initial value versus current density.
    Mean normalized optical power of the LEDs versus the product of the operation time and the cube of the current density.
    Mean normalized optical power (see Fig. 2) versus logarithmic time scale. For different current densities, the characteristic times τ are indicated. Also shown are the logarithmic functions (dashed lines) from Eq. (2) and the extended logarithmic function (solid line) from Eq. (4).
    • Table 1. Experimental Conditions Applied to the Investigated 310 nm UV LEDs

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      Table 1. Experimental Conditions Applied to the Investigated 310 nm UV LEDs

      ExperimentCurrentNom. Current DensityHeat Sink Temp.Operation Time
      No.(mA)(A/cm2)(°C)(h)
      15033.575±14300
      210067.071±11000
      320013441±11000
      430020114±11000
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    Jan Ruschel, Johannes Glaab, Batoul Beidoun, Neysha Lobo Ploch, Jens Rass, Tim Kolbe, Arne Knauer, Markus Weyers, Sven Einfeldt, Michael Kneissl, "Current-induced degradation and lifetime prediction of 310  nm ultraviolet light-emitting diodes," Photonics Res. 7, B36 (2019)

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    Paper Information

    Special Issue: SEMICONDUCTOR UV PHOTONICS

    Received: Feb. 20, 2019

    Accepted: May. 14, 2019

    Published Online: Jun. 21, 2019

    The Author Email: Jan Ruschel (Jan.Ruschel@FBH-Berlin.de)

    DOI:10.1364/PRJ.7.000B36

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