Acta Photonica Sinica, Volume. 46, Issue 8, 823002(2017)
Thickness Estimation Method for Every Functional Layer of QLEDs
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CHEN Wen-bai, YE Ji-xing, MA Hang, LI Deng-hua. Thickness Estimation Method for Every Functional Layer of QLEDs[J]. Acta Photonica Sinica, 2017, 46(8): 823002
Received: Feb. 8, 2017
Accepted: --
Published Online: Oct. 30, 2017
The Author Email: Wen-bai CHEN (chenwb@bistu.edu.cn)