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Acta Photonica Sinica, Volume. 46, Issue 8, 823002(2017)

Thickness Estimation Method for Every Functional Layer of QLEDs

CHEN Wen-bai1,*... YE Ji-xing1, MA Hang1, and LI Deng-hua12 |Show fewer author(s)
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    CHEN Wen-bai, YE Ji-xing, MA Hang, LI Deng-hua. Thickness Estimation Method for Every Functional Layer of QLEDs[J]. Acta Photonica Sinica, 2017, 46(8): 823002

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    Paper Information

    Received: Feb. 8, 2017

    Accepted: --

    Published Online: Oct. 30, 2017

    The Author Email: Wen-bai CHEN (chenwb@bistu.edu.cn)

    DOI:10.3788/gzxb20174608.0823002

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology