Electro-Optic Technology Application, Volume. 39, Issue 1, 60(2024)
Design of Ultra-wide Bandwidth Electro-optic Modulation Chip Parameter Testing System (Invited)
[1] [1] LAUERMANN M,PALMER R,KOEBER S,et al. Low-power silicon-organic hybrid (SOH) modulators for advanced modulation formats[J]. Optics Express, 2014,22(24): 29927.
[2] [2] HALE P D,CLEMENT T S,WILLIAMS D F,et al. Measuring the frequency response of gigabit chip photo-diodes[J]. IEEE J Lightwave Technol,2001,19(9): 1333-1339.
[5] [5] EICHEN E,SCHLAFER J,RIDEOUT W,et al. Wide-bandwidth receiver photo-detector frequency re-sponse measurements using amplified spontaneous emis-sion from a semiconductor optical amplifier[J]. IEEE J Lightwave Technol,1990,1(8): 912-916.
[6] [6] HALE P D,WILLIAMS D F. Calibrated measurement of optoelectronic frequency response[J]. IEEE Transactions on Microwave Theory and Techniques,2003,51(4): 1422-1429.
[7] [7] ZHU N H,WEN J M,SAN H S,et al. Improved optical heterodyne methods for measuring frequency responses of photodetectors[J]. IEEE Journal of Quantum Electron-ics,2006,42(3): 241-248.
[8] [8] WU X M,MAN J W,XIE L,et al. Novel method for frequency response measurement of optoelectronic de-vices[J]. IEEE Photonics Technology Letters,2012,24 (5): 575.
Get Citation
Copy Citation Text
JIN Hui, SHENG Liwen, JU Junwei, HUANG Lin, ZHANG Aiguo, LIU Zhiming, QIAO Shan. Design of Ultra-wide Bandwidth Electro-optic Modulation Chip Parameter Testing System (Invited)[J]. Electro-Optic Technology Application, 2024, 39(1): 60
Category:
Received: Nov. 27, 2023
Accepted: --
Published Online: Jun. 25, 2024
The Author Email:
CSTR:32186.14.