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Electro-Optic Technology Application, Volume. 39, Issue 1, 60(2024)

Design of Ultra-wide Bandwidth Electro-optic Modulation Chip Parameter Testing System (Invited)

JIN Hui1... SHENG Liwen1,2,3, JU Junwei1, HUANG Lin1,2,4, ZHANG Aiguo1, LIU Zhiming1 and QIAO Shan1 |Show fewer author(s)
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  • 1[in Chinese]
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    JIN Hui, SHENG Liwen, JU Junwei, HUANG Lin, ZHANG Aiguo, LIU Zhiming, QIAO Shan. Design of Ultra-wide Bandwidth Electro-optic Modulation Chip Parameter Testing System (Invited)[J]. Electro-Optic Technology Application, 2024, 39(1): 60

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    Received: Nov. 27, 2023

    Accepted: --

    Published Online: Jun. 25, 2024

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology