Electro-Optic Technology Application, Volume. 39, Issue 1, 60(2024)

Design of Ultra-wide Bandwidth Electro-optic Modulation Chip Parameter Testing System (Invited)

JIN Hui1... SHENG Liwen1,2,3, JU Junwei1, HUANG Lin1,2,4, ZHANG Aiguo1, LIU Zhiming1 and QIAO Shan1 |Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
  • show less

    Frequency domain parameters such as bandwidth and response flatness of electro-optical modulator chip are important evaluation indexes to measure the performance of electro-optical modulator chip. The frequency domain parameter testing method of electro-optical modulator chip is studied, and a frequency response parameter testing system of electro-optical modulator chip based on ultra-wide bandwidth lightwave component analyzer is established. The core frequency response parameters of the electro-optical modulator chip are tested in the range of 10 MHz~110 GHz. Experimental results show that the measurement results of the proposed method are in good agreement with the simulation results, and it is an efficient and high-precision method for testing the frequency response parameters of the electro-optical modulator chip.

    Tools

    Get Citation

    Copy Citation Text

    JIN Hui, SHENG Liwen, JU Junwei, HUANG Lin, ZHANG Aiguo, LIU Zhiming, QIAO Shan. Design of Ultra-wide Bandwidth Electro-optic Modulation Chip Parameter Testing System (Invited)[J]. Electro-Optic Technology Application, 2024, 39(1): 60

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Nov. 27, 2023

    Accepted: --

    Published Online: Jun. 25, 2024

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics