Acta Photonica Sinica, Volume. 34, Issue 5, 734(2005)

Influence of Substrate Bias on the Properties of Hard Carbon Films Prepared by MCECR Sputtering

[in Chinese]1, [in Chinese]2, [in Chinese]3, and [in Chinese]3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • show less

    The carbon films exhibit a variety of useful properties such as a hardness approaching that of a diamond, transparency,a smooth surface morphology,wear resistance and chemical inertness,and were widely applied in the fields of mechanics,electronics,optics,and magnetic,and so on. Experimental studies to obtain high quality hard carbon films were conducted using a Mirror-Confinement-type Electron Cyclotron Resonance (MCECR) plasma sputtering method.The carbon films with 40 nm thickness were deposited on Si by sputtering the carbon target with Ar +.The structure of carbon films was analyzed using the X-ray photoelectron spectropscopy (XPS) and high-resolution transmission electron microscopy (HRTEM),the tribological properties were measured using the Pin-on-Disk tribometer,and the nanohardness was measured using the nanoindenter.The effect of substrate bias on the structure,tribological properties,and nanohardness of carbon film was studied in detail,and the best substrate bias was obtained.

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Influence of Substrate Bias on the Properties of Hard Carbon Films Prepared by MCECR Sputtering[J]. Acta Photonica Sinica, 2005, 34(5): 734

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Apr. 8, 2004

    Accepted: --

    Published Online: Jun. 12, 2006

    The Author Email:

    DOI:

    Topics