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Semiconductor Optoelectronics, Volume. 45, Issue 2, 216(2024)

Test Circuit Design and Radiation Experiment Verification of CMOS Image Sensors

WANG Zujun1...2, NIE Xu2, TANG Ning2, WANG Xinghong3, YIN Liyuan4, YAN Shixing2 and LI Chuanzhou2 |Show fewer author(s)
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    WANG Zujun, NIE Xu, TANG Ning, WANG Xinghong, YIN Liyuan, YAN Shixing, LI Chuanzhou. Test Circuit Design and Radiation Experiment Verification of CMOS Image Sensors[J]. Semiconductor Optoelectronics, 2024, 45(2): 216

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    Received: Oct. 5, 2023

    Accepted: --

    Published Online: Aug. 14, 2024

    The Author Email:

    DOI:10.16818/j.issn1001-5868.2023100501

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology