Semiconductor Optoelectronics, Volume. 45, Issue 2, 216(2024)

Test Circuit Design and Radiation Experiment Verification of CMOS Image Sensors

WANG Zujun1...2, NIE Xu2, TANG Ning2, WANG Xinghong3, YIN Liyuan4, YAN Shixing2 and LI Chuanzhou2 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    This study investigated the CMV4000 CMOS image sensor (CIS), which is widely used in the space domain. When designing the test circuit, the CIS radiation circuit board was separated from the FPGA data acquisition and transmission board, and the radiation circuit board and test circuit board communicated through a communication interface to realize radiation shielding protection of the FPGA data acquisition part during a radiation test. This prevented the FPGA data acquisition board from being affected by radiation. The power supply module, data acquisition, memory module, peripheral circuit, and the layout and wiring of the PCB were designed. The Verilog HDL hardware description language was used to drive the timing design of each function module to realize the CIS radiation-sensitive parameter test function. A 60Co γ ray radiation test of the CMV4000 CIS was used to analyze the degradation of radiation-sensitive parameters such as the mean dark signal, dark signal uniformity, and dark signal distribution versus total ionizing dose, and the reliability of the CIS radiation-sensitive parameter test system was verified.

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    WANG Zujun, NIE Xu, TANG Ning, WANG Xinghong, YIN Liyuan, YAN Shixing, LI Chuanzhou. Test Circuit Design and Radiation Experiment Verification of CMOS Image Sensors[J]. Semiconductor Optoelectronics, 2024, 45(2): 216

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    Paper Information

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    Received: Oct. 5, 2023

    Accepted: --

    Published Online: Aug. 14, 2024

    The Author Email:

    DOI:10.16818/j.issn1001-5868.2023100501

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