Semiconductor Optoelectronics, Volume. 41, Issue 5, 724(2020)
Test Methods of CCD Cameras Electronic Gain Based on Arbitrary Scene
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HU Mingpeng, CHENG Junzhou, REN Wangtao, XIONG Rui. Test Methods of CCD Cameras Electronic Gain Based on Arbitrary Scene[J]. Semiconductor Optoelectronics, 2020, 41(5): 724
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Received: May. 27, 2020
Accepted: --
Published Online: Jan. 19, 2021
The Author Email: Mingpeng HU (hmp@ioe.ac.cn)
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