Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Semiconductor Optoelectronics, Volume. 41, Issue 5, 724(2020)

Test Methods of CCD Cameras Electronic Gain Based on Arbitrary Scene

HU Mingpeng1,*... CHENG Junzhou1,2, REN Wangtao1,2, and XIONG Rui12 |Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (2)
    Tools
    Paper Information
    Topics
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    HU Mingpeng, CHENG Junzhou, REN Wangtao, XIONG Rui. Test Methods of CCD Cameras Electronic Gain Based on Arbitrary Scene[J]. Semiconductor Optoelectronics, 2020, 41(5): 724

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category:

    Received: May. 27, 2020

    Accepted: --

    Published Online: Jan. 19, 2021

    The Author Email: Mingpeng HU (hmp@ioe.ac.cn)

    DOI:10.16818/j.issn1001-5868.2020.05.023

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology