A HgTe/ZnO quantum dots vertically stacked heterojunction low dark current photodetector

Xin-Ning HUANG; Teng-Teng JIANG; Yun-Xiang DI; Mao-Bin XIE; Tian-Le GUO; Jing-Jing LIU; Bin-Min WU; Jing-Mei SHI; Qiang QIN; Gong-Rong DENG; Yan CHEN; Tie LIN; Hong SHEN; Xiang-Jian MENG; Xu-Dong WANG; Jun-Hao CHU; Jun GE; Jian-Lu WANG

doi:10.11972/j.issn.1001-9014.2025.01.002

Journal of Infrared and Millimeter Waves, Volume. 44, Issue 1, 9(2025)

A HgTe/ZnO quantum dots vertically stacked heterojunction low dark current photodetector

Xin-Ning HUANG^1,2, Teng-Teng JIANG^1,2, Yun-Xiang DI¹, Mao-Bin XIE^1,2, Tian-Le GUO^1、*, Jing-Jing LIU¹, Bin-Min WU¹, Jing-Mei SHI⁴, Qiang QIN⁴, Gong-Rong DENG⁴, Yan CHEN¹, Tie LIN¹, Hong SHEN¹, Xiang-Jian MENG¹, Xu-Dong WANG¹, Jun-Hao CHU^1,2, Jun GE^1、**, and Jian-Lu WANG³

Author Affiliations

¹State Key Laboratory of Infrared Physics，Shanghai Institute of Technical Physics，Chinese Academy of Sciences，Shanghai 200083，China

²University of Chinese Academy of Sciences，Beijing 100049，China

³Frontier Institute of Chip and System，Institute of Optoelectronics，Shanghai Frontier Base of Intelligent Optoelectronics and Perception，Fudan University，Shanghai 200438，China

⁴Kunming Institute of Physics，Kunming 650223，China

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References(27)

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Xin-Ning HUANG, Teng-Teng JIANG, Yun-Xiang DI, Mao-Bin XIE, Tian-Le GUO, Jing-Jing LIU, Bin-Min WU, Jing-Mei SHI, Qiang QIN, Gong-Rong DENG, Yan CHEN, Tie LIN, Hong SHEN, Xiang-Jian MENG, Xu-Dong WANG, Jun-Hao CHU, Jun GE, Jian-Lu WANG. A HgTe/ZnO quantum dots vertically stacked heterojunction low dark current photodetector[J]. Journal of Infrared and Millimeter Waves, 2025, 44(1): 9

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Paper Information

Category: Infrared Physics, Materials and Devices

Received: Mar. 20, 2024

Accepted: --

Published Online: Mar. 5, 2025

The Author Email: GUO Tian-Le (guotianle@mail.sitp.ac.cn), GE Jun (Wonderge@163.com)

DOI:10.11972/j.issn.1001-9014.2025.01.002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology