Laser & Optoelectronics Progress, Volume. 60, Issue 24, 2412006(2023)
Polished Surface Defect Detection Based on Intelligent Surface Analysis
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Zihao Li, Fengzhou Fang, Zhonghe Ren, Gaofeng Hou. Polished Surface Defect Detection Based on Intelligent Surface Analysis[J]. Laser & Optoelectronics Progress, 2023, 60(24): 2412006
Category: Instrumentation, Measurement and Metrology
Received: Mar. 15, 2023
Accepted: Apr. 23, 2023
Published Online: Nov. 27, 2023
The Author Email: Fang Fengzhou (fzfang@tju.edu.cn)