Laser & Optoelectronics Progress, Volume. 60, Issue 24, 2412006(2023)
Polished Surface Defect Detection Based on Intelligent Surface Analysis
Fig. 1. Data collection system
Fig. 2. Overall defect detection scheme based on surface analysis
Fig. 3. Schematic diagram of intelligent profile analysis
Fig. 4. Structure of FETN
Fig. 5. Structure of FIFE block
Fig. 6. Structure of cascaded receptive field enhancement defect detection model
Fig. 7. Backbone network structure of defect detection model. (a) Backbone network structure; (b) comparison of defect characteristic receptive field
Fig. 8. UPP-CLS dataset label distribution. (a) Label distribution before data balancing; (b) label distribution after data balancing
Fig. 9. Results of FETN intelligent profile analysis and filtering
Fig. 10. Height-to-width ratio statistics of dimension box in dataset
Fig. 11. Comparison of the results between the proposed detection model and other mainstream detection models on the UPP-DET dataset. (a) Overall comparison; (b) partial comparison
Fig. 12. Test results of defect detection model
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Zihao Li, Fengzhou Fang, Zhonghe Ren, Gaofeng Hou. Polished Surface Defect Detection Based on Intelligent Surface Analysis[J]. Laser & Optoelectronics Progress, 2023, 60(24): 2412006
Category: Instrumentation, Measurement and Metrology
Received: Mar. 15, 2023
Accepted: Apr. 23, 2023
Published Online: Nov. 27, 2023
The Author Email: Fang Fengzhou (fzfang@tju.edu.cn)