Laser & Optoelectronics Progress, Volume. 60, Issue 24, 2412006(2023)

Polished Surface Defect Detection Based on Intelligent Surface Analysis

Zihao Li1,2, Fengzhou Fang1,2、*, Zhonghe Ren1,2, and Gaofeng Hou1,2
Author Affiliations
  • 1State Key Laboratory of Precision Measuring Technology and Instrument, Tianjin University, Tianjin 300072, China
  • 2Labotatory of Micro/Nano Manufacturing Technology (MNMT), Tianjin 300072, China
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    Figures & Tables(18)
    Data collection system
    Overall defect detection scheme based on surface analysis
    Schematic diagram of intelligent profile analysis
    Structure of FETN
    Structure of FIFE block
    Structure of cascaded receptive field enhancement defect detection model
    Backbone network structure of defect detection model. (a) Backbone network structure; (b) comparison of defect characteristic receptive field
    UPP-CLS dataset label distribution. (a) Label distribution before data balancing; (b) label distribution after data balancing
    Results of FETN intelligent profile analysis and filtering
    Height-to-width ratio statistics of dimension box in dataset
    Comparison of the results between the proposed detection model and other mainstream detection models on the UPP-DET dataset. (a) Overall comparison; (b) partial comparison
    Test results of defect detection model
    • Table 1. Basic parameters of the experiment

      View table

      Table 1. Basic parameters of the experiment

      ParameterUPP-CLSUPP-DET
      Batch size84
      Epoch5015
      Initial learning rate0.0010.0002
      Weight decay0.05
      OptimizerAdamAdamW
      RegularizationL2 weight decay
    • Table 2. Module performance analysis in the FIFE Block

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      Table 2. Module performance analysis in the FIFE Block

      Vector orderingSCSEAccuracy /%
      LC
      75.18
      74.39
      78.07
      78.24
      79.47
    • Table 3. Comparative analysis of each model embedded in FIFE block

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      Table 3. Comparative analysis of each model embedded in FIFE block

      Image branch backboneFIFEAccuracy /%Sensitivity /%FNR /%TNR /%Specificity /%
      InceptionV32370.4768.8331.1773.1726.83
      74.4471.2328.7777.7022.30
      ResNet-502175.1873.6426.3677.8822.12
      79.4776.1223.8876.2723.73
      ResNet-1012178.6376.0323.9780.0020.00
      83.9879.6820.3283.2116.79
      MobileNetV32470.0972.1127.8971.6728.33
      75.6972.9927.0176.3523.65
      ResNext-502578.8777.6922.3180.0419.96
      82.2177.1522.8584.7615.24
      EfficientNet-b21980.4178.2521.7582.6717.33
      84.8680.8919.1186.3813.62
      EfficientNet-b41982.1179.9720.0384.6415.36
      85.3681.4918.5187.7212.28
    • Table 4. Performance analysis of each model embedded in FIFE block

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      Table 4. Performance analysis of each model embedded in FIFE block

      ADMixupDCmAP
      0.697
      0.721
      0.729
      0.740
    • Table 5. Comparison results between proposed model and other detection models

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      Table 5. Comparison results between proposed model and other detection models

      StageMethodBackboneMSTScratchPitmAPFPS /(frame·s-1
      One-stageSSD30027VGG-160.3630.3350.349
      SSD51227VGG-160.5810.5930.587
      RetinaNet28ResNet-500.7750.7490.762
      Yolov329DarkNet-530.6320.5940.613
      Yolov5DarkNet-530.8160.7820.799
      Two-stageFaster R-CNN30ResNet-500.7290.7510.74028.3
      Dynamic R-CNN31ResNet-500.8160.7980.80724.9
      Cascade R-CNN18ResNet-500.8150.8220.81922.7
      ProposedEfficientNet-b40.8670.8400.85421.1
    • Table 6. IoU threshold analysis results at each stage of defect detection model detection head

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      Table 6. IoU threshold analysis results at each stage of defect detection model detection head

      No.TIoUmAP
      Baseline[0.5,0.6,0.7]0.854
      1[0.2,0.6,0.7]0.841
      2[0.3,0.6,0.7]0.853
      3[0.4,0.6,0.7]0.856
      4[0.4,0.5,0.6]0.851
      5[0.4,0.5,0.7]0.862
      6[0.4,0.5,0.8]0.839
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    Zihao Li, Fengzhou Fang, Zhonghe Ren, Gaofeng Hou. Polished Surface Defect Detection Based on Intelligent Surface Analysis[J]. Laser & Optoelectronics Progress, 2023, 60(24): 2412006

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 15, 2023

    Accepted: Apr. 23, 2023

    Published Online: Nov. 27, 2023

    The Author Email: Fang Fengzhou (fzfang@tju.edu.cn)

    DOI:10.3788/LOP230868

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